[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Use of multiple I/sub DDQ/ test metrics for outlier identification
Sabade, S.S., Walker, D.M.H.Year:
2003
Language:
english
DOI:
10.1109/VTEST.2003.1197630
File:
PDF, 520 KB
english, 2003