[IEEE 2009 First International Conference on Advances in System Testing and Validation Lifecycle (VALID) - Porto, Portugal (2009.09.20-2009.09.25)] 2009 First International Conference on Advances in System Testing and Validation Lifecycle - Diagnosability of Input Output Symbolic Transition Systems
Bourgne, Gauvain, Dague, Philippe, Nouioua, Farid, Rapin, NicolasYear:
2009
Language:
english
DOI:
10.1109/valid.2009.35
File:
PDF, 256 KB
english, 2009