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[IEEE Oper. Center 2003 International Semiconductor Conference. CAS 2003 - Sinaia, Romania (28 Sept.-2 Oct. 2003)] 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676) - Characterization of thin ZnO film by optical second harmonic generation: experiment and theory
Buinitskaya, G., Kravetsky, I., Kulyuk, L., Mirovitskii, V., Rusu, E.Year:
2003
Language:
english
DOI:
10.1109/smicnd.2003.1252444
File:
PDF, 206 KB
english, 2003