[IEEE 2013 IEEE Custom Integrated Circuits Conference - CICC 2013 - San Jose, CA, USA (2013.09.22-2013.09.25)] Proceedings of the IEEE 2013 Custom Integrated Circuits Conference - Characterization of matching variability and low-frequency noise for mixed-signal technologies
Tuinhout, HansYear:
2013
DOI:
10.1109/cicc.2013.6658503
File:
PDF, 4.11 MB
2013