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[IEEE 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Istanbul, Turkey (2013.10.7-2013.10.9)] 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - On the development of diagnostic test programs for VLIW processors
Sabena, D., Reorda, M. Sonza, Sterpone, L.Year:
2013
Language:
english
DOI:
10.1109/vlsi-soc.2013.6673255
File:
PDF, 313 KB
english, 2013