[IEEE 2013 20th IEEE International Symposium on the...

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[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - High resolution Magnetic Current Imaging for die level short localization

Gaudestad, J., Gagliolo, N., Talanov, V. V., Yeh, R. H., Ma, C. J.
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Year:
2013
DOI:
10.1109/IPFA.2013.6599179
File:
PDF, 730 KB
2013
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