[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - High resolution Magnetic Current Imaging for die level short localization
Gaudestad, J., Gagliolo, N., Talanov, V. V., Yeh, R. H., Ma, C. J.Year:
2013
DOI:
10.1109/IPFA.2013.6599179
File:
PDF, 730 KB
2013