Taguchi Based Performance and Reliability Improvement of an Ion Chamber Amplifier for Enhanced Nuclear Reactor Safety
Kulkarni, R. D., Agarwal, VivekVolume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2008.2001124
Date:
August, 2008
File:
PDF, 472 KB
english, 2008