EPR studies of native and impurity-related defects in...

Materials Science in Semiconductor Processing 2003 Vol. 6; Iss. 5-6

EPR studies of native and impurity-related defects in II–IV–V2 semiconductors

W. Gehlhoff, D. Azamat, A. Hoffmann
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Volume:
6
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/j.mssp.2003.07.027
File:
PDF, 329 KB
english, 2003
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