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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Improved sequential ATPG using functional observation information and new justification methods
Jaehong Park,, Chanhee Oh,, Mercer, M.R.Year:
1995
Language:
english
DOI:
10.1109/edtc.1995.470386
File:
PDF, 457 KB
english, 1995