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[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Using a CISC microcontroller to test embedded memories
van de Goor, Ad, Hamdioui, Said, Gaydadjiev, GeorgiYear:
2010
Language:
english
DOI:
10.1109/DDECS.2010.5491773
File:
PDF, 308 KB
english, 2010