InGaP/GaAs HBT implantation leakage current and electrical...

Materials Science in Semiconductor Processing 2004 Vol. 7; Iss. 1-2

InGaP/GaAs HBT implantation leakage current and electrical breakdown

Hong Shen, A.M Arrale, Peter Dai, Shiban Tiku, Ravi Ramanathan
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Volume:
7
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.mssp.2004.05.003
File:
PDF, 266 KB
english, 2004
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