[IEEE 2010 2nd International Conference on Reliability,...

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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - A Commercial-Off-the-Shelf(COTS) dedication of a QNX real time operating system (RTOS)

Jang Yeol Kim,, Young Jun Lee,, Se Woo Cheon,, Jang Soo Lee,, Kee Choon Kwon,
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Year:
2010
Language:
english
DOI:
10.1109/ICRESH.2010.5779528
File:
PDF, 1.51 MB
english, 2010
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