Physical and electrical characterization of polysilicon vs....

Physical and electrical characterization of polysilicon vs. TiN gate electrodes for HfO2 transistors

Patrick S. Lysaght, Jeff J. Peterson, Brendan Foran, Chadwin D. Young, Gennadi Bersuker, Howard R. Huff
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Volume:
7
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mssp.2004.09.111
File:
PDF, 511 KB
english, 2004
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