[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - ESD protection for sub-45 nm MugFET technology
Natarajan, M.I., Thijs, S., Tremouilles, D., Linten, D., Collaert, N., Jurczak, M., Groeseneken, G.Year:
2007
Language:
english
DOI:
10.1109/IPFA.2007.4378077
File:
PDF, 3.61 MB
english, 2007