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[IEEE 2011 IEEE 9th International Conference on ASIC (ASICON 2011) - Xiamen, China (2011.10.25-2011.10.28)] 2011 9th IEEE International Conference on ASIC - Variation-resilient voltage generation for SRAM weak cell testing

Chingwei Yeh,, Yan-Nan Liu,, Jinn-Shyan Wang,, Pei-Yao Chang,
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Year:
2011
Language:
english
DOI:
10.1109/asicon.2011.6157168
File:
PDF, 1.09 MB
english, 2011
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