[IEEE 1997 IEEE International Conference on Microelectronic...

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[IEEE 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Monterey, CA, USA (17-20 March 1997)] 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - A statistical method for the analysis of CMOS process fluctuations on dynamic performance

De Almeida, M., Regnier, X., Daga, J.M., Robert, M., Auvergne, D.
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Year:
1997
Language:
english
DOI:
10.1109/icmts.1997.589361
File:
PDF, 528 KB
english, 1997
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