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[IEEE 2012 IEEE International Conference on Condition Monitoring and Diagnosis (CMD) - Bali, Indonesia (2012.09.23-2012.09.27)] 2012 IEEE International Conference on Condition Monitoring and Diagnosis - Improved risk analysis through failure mode classification according to occurrence time
Mehairjan, Ravish P. Y., Zhuang, Qikai, Djairam, Dhiradj, Smit, Johan J.Year:
2012
Language:
english
DOI:
10.1109/cmd.2012.6416287
File:
PDF, 346 KB
english, 2012