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[IEEE 1982 Ultrasonics Symposium - San Diego, CA, USA (1982.10.27-1982.10.29)] 1982 Ultrasonics Symposium - An Analysis of Thickness-Extensional Trapped Energy Mode Transducers
Shick, D.V., Tiersten, H.F.Year:
1982
Language:
english
DOI:
10.1109/ultsym.1982.197879
File:
PDF, 375 KB
english, 1982