Proton induced damage in SiC light emitting diodes

IEEE Transactions on Nuclear Science 1998 / Dec. Vol. 45; Iss. 6

Proton induced damage in SiC light emitting diodes

Hinrichsen, P.F., Houdayer, A.J., Barry, A.L., Vincent, J.
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Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.736532
Date:
January, 1998
File:
PDF, 681 KB
english, 1998
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