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Dependence of characteristic diode parameters on sample temperature in Ni/epitaxy n-Si contacts
K. Ejderha, A. Zengin, İ. Orak, B. Tasyurek, T. Kilinç, A. TurutVolume:
14
Year:
2011
Language:
english
Pages:
8
DOI:
10.1016/j.mssp.2010.12.010
File:
PDF, 423 KB
english, 2011