[IEEE 2011 IEEE International Test Conference (ITC) -...

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[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Deterministic IDDQ diagnosis using a net activation based model

Kun, Andras, Arnold, Ralf, Heinrich, Peter, Maugard, Guenole, Tang, Huaxing, Cheng, Wu-Tung
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Year:
2011
Language:
english
DOI:
10.1109/test.2011.6139175
File:
PDF, 790 KB
english, 2011
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