[IEEE 2012 IEEE International Conference on IC Design &...

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[IEEE 2012 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2012.05.30-2012.06.1)] 2012 IEEE International Conference on IC Design & Technology - On-chip MOS PVT variation monitor for slew rate self-adjusting 2×VDD output buffers

Chih-Lin Chen,, Hsin-Yuan Tseng,, Kuo, Ron-Chi, Wang, Chua-Chin
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Year:
2012
Language:
english
DOI:
10.1109/icicdt.2012.6232876
File:
PDF, 1.16 MB
english, 2012
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