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Reliability of AlGaInP light emitting diodes with an ITO current spreading layer
Wei, Gao, Weiling, Guo, Yanxu, Zhu, Wenjing, Jiang, Guangdi, ShenVolume:
30
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/30/6/064004
Date:
June, 2009
File:
PDF, 186 KB
english, 2009