Reliability of AlGaInP light emitting diodes with an ITO...

Reliability of AlGaInP light emitting diodes with an ITO current spreading layer

Wei, Gao, Weiling, Guo, Yanxu, Zhu, Wenjing, Jiang, Guangdi, Shen
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Volume:
30
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/30/6/064004
Date:
June, 2009
File:
PDF, 186 KB
english, 2009
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