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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Availability growth modeling and assessment
Bluvband, Zigmund, Porotsky, SergeyYear:
2011
Language:
english
DOI:
10.1109/rams.2011.5754456
File:
PDF, 440 KB
english, 2011