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[IEEE 2012 IEEE AUTOTESTCON - Anaheim, CA, USA (2012.09.10-2012.09.13)] 2012 IEEE AUTOTESTCON Proceedings - Testability modeling usage in design-for-test and product lifecycle cost reduction
Valfre, JamesYear:
2012
Language:
english
DOI:
10.1109/autest.2012.6334543
File:
PDF, 587 KB
english, 2012