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[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Reliable Hardware Architectures for the Third-Round SHA-3 Finalist Grostl Benchmarked on FPGA Platform
Mozaffari-Kermani, Mehran, Reyhani-Masoleh, ArashYear:
2011
Language:
english
DOI:
10.1109/dft.2011.60
File:
PDF, 184 KB
english, 2011