[IEEE Comput. Soc. Press Records of the 1993 IEEE International Workshop on Memory Testing - San Jose, CA, USA (9-10 Aug. 1993)] Records of the 1993 IEEE International Workshop on Memory Testing - Associative search based test algorithms for test acceleration in FAST-RAMs
Elm, C., Tavangarian, D.Year:
1993
Language:
english
DOI:
10.1109/mt.1993.263152
File:
PDF, 591 KB
english, 1993