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[IEEE ICVC'99. 6th International Conference on VLSI and CAD - Seoul, South Korea (26-27 Oct. 1999)] ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) - A novel cell charge evaluation scheme and test method for 4 Mb nonvolatile ferroelectric RAM
Byung-Gil Jeon,, Moon-Kyu Choi,, Seung-Gyu Oh,, Yeonbae Chung,, Kang-Deog Suh,, Kinam Kim,Year:
1999
Language:
english
DOI:
10.1109/icvc.1999.820905
File:
PDF, 251 KB
english, 1999