![](/img/cover-not-exists.png)
[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - An Incremental Approach to Functional Diagnosis
Amati, Luca, Bolchini, Cristiana, Frigerio, Laura, Salice, Fabio, Eklow, William, Suvatne, Arnold, Brambilla, Eugenio, Franzoso, Federico, Martin, MicheleYear:
2009
Language:
english
DOI:
10.1109/dft.2009.29
File:
PDF, 370 KB
english, 2009