[IEEE 2007 2nd International Design and Test Workshop - Cairo, Egypt (2007.12.16-2007.12.18)] 2007 2nd International Design and Test Workshop - Measurement Environment for Reliability Study of High Current First Level Interconnections
Barton, Zdenek, Horky, Jiri, Duda, Radoslav, Szendiuch, Ivan, Novotny, Marek, Gevaert, DorineYear:
2007
Language:
english
DOI:
10.1109/idt.2007.4437430
File:
PDF, 1.26 MB
english, 2007