![](/img/cover-not-exists.png)
[IEEE 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Monterey, CA, USA (2007.08.26-2007.08.30)] 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Nitride Trapping Memory Technology to Realize Flash-Embedded SoC of 65nm and Beyond
Takahashi, Nobuyoshi, Arai, Masatoshi, Takahashi, Keita, Kawashima, Koichi, Moriyama, Yoshiya, Kurihara, Kiyoshi, Matsuo, IchiroYear:
2007
Language:
english
DOI:
10.1109/nvsmw.2007.4290594
File:
PDF, 214 KB
english, 2007