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[IEEE Comput. Soc 1998 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Santa Barbara, CA, USA (23-25 June 1998)] Proceedings. 1998 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (Cat. No.98CB36231) - Creaseness measures for CT and MR image registration
Lopez, A.M., Lloret, D., Serrat, J.Year:
1998
Language:
english
DOI:
10.1109/CVPR.1998.698679
File:
PDF, 861 KB
english, 1998