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[IEEE 2012 79th ARFTG Microwave Measurement Conference (ARFTG) - Montreal, QC, Canada (2012.06.22-2012.06.22)] 79th ARFTG Microwave Measurement Conference - Characteristic impedance determination technique for CMOS on-wafer transmission line with large substrate loss
Takano, Kyoya, Amakawa, Shuhei, Katayama, Kosuke, Motoyoshi, Mizuki, Fujishima, MinoruYear:
2012
Language:
english
DOI:
10.1109/arftg79.2012.6291203
File:
PDF, 1.38 MB
english, 2012