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[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Inconsistent Fail due to Limited Tester Timing Accuracy
Park, Intaik, Lee, Donghwi, Chmelar, Erik, McCluskey, Edward J.Year:
2008
Language:
english
DOI:
10.1109/vts.2008.23
File:
PDF, 417 KB
english, 2008