[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Diode-triggered SCR (DTSCR) for RF-ESD protection of BiCMOS SiGe HBTs and CMOS ultra-thin gate oxides
Mergens, M.P.J., Russ, C.C., Verhaege, K.G., Armer, J., Jozwiak, P.C., Mohn, R., Keppens, B., Trinh, C.S.Year:
2003
Language:
english
DOI:
10.1109/iedm.2003.1269334
File:
PDF, 339 KB
english, 2003