![](/img/cover-not-exists.png)
[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - A Comprehensive Study of Low-k SiCOH TDDB Phenomena and Its Reliability Lifetime Model Development
Chen, F., Bravo, O., Chanda, K., McLaughlin, P., Sullivan, T., Gill, J., Lloyd, J., Kontra, R., Aitken, J.Year:
2006
Language:
english
DOI:
10.1109/relphy.2006.251190
File:
PDF, 347 KB
english, 2006