![](/img/cover-not-exists.png)
[IEEE 5th International Conference on Properties and Applications of Dielectric Materials - Seoul, South Korea (25-30 May 1997)] Proceedings of 5th International Conference on Properties and Applications of Dielectric Materials - Effects of the thickness on the dielectric reliability of multilayered BaTiO/sub 3/ insulating layer
Jeong-Hoon Oh,, Yun-Hi Lee,, Byeong-Kwon Ju,, Chang-Yub Park,, Shin, D.K., Myung-Hwan Oh,Volume:
2
Year:
1997
Language:
english
DOI:
10.1109/icpadm.1997.616621
File:
PDF, 227 KB
english, 1997