Degradation of Laser-Crystallized Laterally Grown Poly-Si...

IEEE Electron Device Letters 2007 / 05 Vol. 28; Iss. 5

Degradation of Laser-Crystallized Laterally Grown Poly-Si TFT under Dynamic Stress

Liu, Po-Tsun, Lu, Hau-Yan, Chen, Yu-Cheng, Chi, Sien
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Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.895388
Date:
May, 2007
File:
PDF, 286 KB
english, 2007
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