![](/img/cover-not-exists.png)
Degradation of Laser-Crystallized Laterally Grown Poly-Si TFT under Dynamic Stress
Liu, Po-Tsun, Lu, Hau-Yan, Chen, Yu-Cheng, Chi, SienVolume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.895388
Date:
May, 2007
File:
PDF, 286 KB
english, 2007