In Situ Investigation of Current Transport Across Pt/n-Si...

IEEE Transactions on Device and Materials Reliability 2013 / 03 Vol. 13; Iss. 1

In Situ Investigation of Current Transport Across Pt/n-Si (100) Schottky Junction During 100 $\hbox{MeV Ni}^{+7}$ Ion Irradiation

Verma, Shammi, Praveen, Kumsi C., Kumar, Tanuj, Kanjilal, Dinakar
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Volume:
13
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2012.2217396
Date:
March, 2013
File:
PDF, 641 KB
english, 2013
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