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[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Simulation of hot-carrier degradation using self-consistent solution of semiconductor energy-balance equations and oxide carrier transport equations
Mukundan, S.K., Pagey, M.P., Schrimpf, R.D., Galloway, K.F.Year:
1999
Language:
english
DOI:
10.1109/IRWS.1999.830565
File:
PDF, 427 KB
english, 1999