[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Comparing numerical and experimental results for the shielding properties of a doubly-periodic array of apertures in a thick conducting screen
Love, D.C., Ladbury, J.M., Rothwell, E.J.Year:
2006
Language:
english
DOI:
10.1109/isemc.2006.1706405
File:
PDF, 138 KB
english, 2006