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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Defect-oriented cell-internal testing
Hapke, F., Redemund, W., Schloeffel, J., Krenz-Baath, R., Glowatz, A., Wittke, M., Hashempour, H., Eichenberger, S.Year:
2010
Language:
english
DOI:
10.1109/test.2010.5699229
File:
PDF, 786 KB
english, 2010