[IEEE Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (28-29 July 2003)] Proceedings the Third IEEE Workshop on Internet Applications. WIAPP 2003 - A testability-driven optimizer and wrapper generator for embedded memories
Rei-Fu Huang,, Li-Ming Denq,, Cheng-Wen Wu,, Jin-Fu Li,Year:
2003
Language:
english
DOI:
10.1109/mtdt.2003.1222361
File:
PDF, 229 KB
english, 2003