[IEEE Records of the 2003 IEEE International Workshop on...

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[IEEE Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (28-29 July 2003)] Proceedings the Third IEEE Workshop on Internet Applications. WIAPP 2003 - A testability-driven optimizer and wrapper generator for embedded memories

Rei-Fu Huang,, Li-Ming Denq,, Cheng-Wen Wu,, Jin-Fu Li,
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Year:
2003
Language:
english
DOI:
10.1109/mtdt.2003.1222361
File:
PDF, 229 KB
english, 2003
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