Picosecond photoemission probing of integrated circuits:...

IBM Journal of Research and Development 1990 / 03 Vol. 34; Iss. 2.3

Picosecond photoemission probing of integrated circuits: Capabilities, limitations, and applications

Clauberg, R., Beha, H., Blacha, A., Seitz, H. K.
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Volume:
34
Language:
english
Journal:
IBM Journal of Research and Development
DOI:
10.1147/rd.342.0173
Date:
March, 1990
File:
PDF, 1.44 MB
english, 1990
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