[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - Crossing point current of power P-i-N diodes: impact of lifetime treatment
Vobecky, J., Hazdra, P., Humbel, O., Galster, N.Volume:
2
Year:
1999
Language:
english
DOI:
10.1109/icmel.2000.838768
File:
PDF, 329 KB
english, 1999