![](/img/cover-not-exists.png)
[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - Power and noise aware test using preliminary estimation
Kenji Noda,, Hideaki Ito,, Kazumi Hatayama,, Takashi Aikyo,Year:
2009
Language:
english
DOI:
10.1109/vdat.2009.5158160
File:
PDF, 252 KB
english, 2009