[IEEE 2009 International Symposium on VLSI Design,...

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[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - Power and noise aware test using preliminary estimation

Kenji Noda,, Hideaki Ito,, Kazumi Hatayama,, Takashi Aikyo,
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Year:
2009
Language:
english
DOI:
10.1109/vdat.2009.5158160
File:
PDF, 252 KB
english, 2009
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