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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Test-architecture optimization for TSV-based 3D stacked ICs
Noia, Brandon, Goel, Sandeep Kumar, Chakrabarty, Krishnendu, Marinissen, Erik Jan, Verbree, JoukeYear:
2010
Language:
english
DOI:
10.1109/etsym.2010.5512787
File:
PDF, 663 KB
english, 2010