[IEEE 2006 7th International Conference on Computer-Aided...

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[IEEE 2006 7th International Conference on Computer-Aided Industrial Design and Conceptual Design - Hangzhou, China (2006.11.17-2006.11.19)] 2006 7th International Conference on Computer-Aided Industrial Design and Conceptual Design - An improved facial feature localization method based on ASM

Yi-Bin, Shi, Jian-Ming, Zhang, Jian-Hua, Tian, Geng-Tao, Zhou
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Year:
2006
Language:
english
DOI:
10.1109/caidcd.2006.329357
File:
PDF, 129 KB
english, 2006
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