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[IEEE 2013 IEEE Electrical Insulation Conference (EIC) - Ottawa, ON, Canada (2013.06.2-2013.06.5)] 2013 IEEE Electrical Insulation Conference (EIC) - Tailoring of the electrical properties of silicon carbide for field grading application
Vanga-Bouanga, C., Reid, T. F., David, E., Frechette, M. F., Savoie, S.Year:
2013
Language:
english
DOI:
10.1109/eic.2013.6554246
File:
PDF, 328 KB
english, 2013