[IEEE 2013 IEEE Electrical Insulation Conference (EIC) -...

  • Main
  • [IEEE 2013 IEEE Electrical Insulation...

[IEEE 2013 IEEE Electrical Insulation Conference (EIC) - Ottawa, ON, Canada (2013.06.2-2013.06.5)] 2013 IEEE Electrical Insulation Conference (EIC) - Tailoring of the electrical properties of silicon carbide for field grading application

Vanga-Bouanga, C., Reid, T. F., David, E., Frechette, M. F., Savoie, S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2013
Language:
english
DOI:
10.1109/eic.2013.6554246
File:
PDF, 328 KB
english, 2013
Conversion to is in progress
Conversion to is failed