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[IEEE 2008 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD) - Sydney, Australia (2008.07.28-2008.08.1)] 2008 Conference on Optoelectronic and Microelectronic Materials and Devices - Characterisation of nitrogen-related defects in compound semiconductors by near-edge x-ray absorption fine structure
Petravic, Mladen, Majlinger, Zlatko, Bozanic, Ana, Yang, Yaw-Wen, Gao, Michael, Crotti, C.Year:
2008
Language:
english
DOI:
10.1109/commad.2008.4802100
File:
PDF, 636 KB
english, 2008